The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2005
Filed:
Jun. 18, 2003
Keith R. Jones, Irvine, CA (US);
Gilberto Isaac Sada Treviño, Irvine, CA (US);
Ragnar H. Jonsson, Reykjavik, IS;
William W. Jones, Aliso Viejo, CA (US);
Keith R. Jones, Irvine, CA (US);
Gilberto Isaac Sada Treviño, Irvine, CA (US);
Ragnar H. Jonsson, Reykjavik, IS;
William W. Jones, Aliso Viejo, CA (US);
Mindspeed Technologies, Inc., Newport Beach, CA (US);
Abstract
A method and system for performing sequence time domain reflectometry over a communication channel to determine the location of line anomalies in the communication channel is disclosed. In one embodiment, the system generates a sequence signal and transmits the sequence signal over an optical channel. The system receives one or more reflection signals over the optical channel and performs reflection signal processing on the reflection signal. In one embodiment, the optical reflection is transformed to an electrical signal and correlated with the original sequence signal to generate a correlated signal. The time between the start of the reflection signal and a subsequent point of correlation and the rate of propagation reveals a line anomaly location. A circulator, beam splitter, or any other similar device may direct the reflection signal to the apparatus configured to perform reflection signal processing.