The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2005

Filed:

Jan. 30, 2002
Applicants:

Andreas Held, Zürich, CH;

Markus Näf, Zürich, CH;

Inventors:

Andreas Held, Zürich, CH;

Markus Näf, Zürich, CH;

Assignee:

Imaging Solutions AG, Wettingen, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K009/00 ; G06K009/40 ;
U.S. Cl.
CPC ...
Abstract

The present invention refers to a method for automatically correcting color defective areas in an image, which defective color areas were recorded with a color spectrum deviating from the actual color spectrum of said areas without color defects, wherein basic areas in the image are identified on the basis of features which are common for these recorded defective areas, said basic areas supporting an increased likelihood to include defective areas, and the processing is then reduced to the basic areas to identify borderlines and/or centres of the defective areas, and afterwards, it is identified whether the localized basic area or areas deemed to be defective are defective or not, and finally, if a localized basic area has been identified to be defective, a correction mask is created to correct the visual appearance of the defective area.


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