The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2005
Filed:
Mar. 24, 2004
Yoshihiro Hama, Saitama-ken, JP;
Yoshihiro Hama, Saitama-ken, JP;
PENTAX Corporation, Tokyo, JP;
Abstract
A multibeam scanning device includes a deflecting system that deflects a plurality of beams, which are emitted by a light source, in a main scanning direction. On a first imaging optical system, the dynamically deflected beams are incident. A plurality of optical path deflection units deflect the optical paths of the optical beams passed through the first imaging optical system, respectively. Each of the plurality of optical path deflection units is capable of varying the deflection direction of the beam in the auxiliary scanning direction. A plurality of second imaging optical systems converge the beams deflected by the deflection units on target surfaces, respectively. A position adjusting system is provided to adjust a position of each of the second imaging optical systems so that the positional relationship of the second imaging optical system with respect to the beam incident thereon is maintained.