The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2005
Filed:
Sep. 13, 2002
Masashi Kitabayashi, Horigane-mura, JP;
Yuji Takado, Matsumoto, JP;
Masashi Kitabayashi, Horigane-mura, JP;
Yuji Takado, Matsumoto, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
The invention provides an optical element inspection device and an optical element inspection method capable of inspecting a relative position of each reflective surface of an optical element. An optical element inspection device includes a pedestal with a cross-dichroic prism installed thereon, an autocollimator which introduces the measurement light into any of four reflective surfaces at the angle of incidence of 45°, and detects the return light thereof, and a switching device to introduce the measurement light into only either a left area or a right area. The relative position between two reflective surfaces of each color reflective surface can be easily inspected by introducing the measurement light in only the reflective surface of either area of the color reflective surface by a switching device.