The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2005
Filed:
Nov. 22, 2002
Applicants:
Dwight U. Bartholomew, Dallas, TX (US);
Keren Deng, Plano, TX (US);
Inventors:
Dwight U. Bartholomew, Dallas, TX (US);
Keren Deng, Plano, TX (US);
Assignee:
Other;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N021/55 ;
U.S. Cl.
CPC ...
Abstract
A surface plasmon resonance sensor or critical angle sensor has a reflecting surface which is optically flat and exposed to air on one side. Light reflecting from a sensing surface of the sensor which impinges on the reflecting surface at an angle which is less than the critical angle passes into the air whereas light which impinges at an angle which is equal to or greater than the critical angle is reflected onto a photodetector. The critical angle reflection from the reflecting surface provides a total internal reflection (TIR) characteristic which is used to calibrate the sensor.