The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2005

Filed:

Aug. 05, 2002
Applicants:

Robert Bennett, Gloucestershire, GB;

Andrew Mark Woolfrey, Gloucestershire, GB;

John Charles Clifford Day, Bristol, GB;

Angus Bewick, Bristol, GB;

Inventors:

Robert Bennett, Gloucestershire, GB;

Andrew Mark Woolfrey, Gloucestershire, GB;

John Charles Clifford Day, Bristol, GB;

Angus Bewick, Bristol, GB;

Assignee:

Renishaw PLC, Gloucestershire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J003/44 ; G01J003/28 ; H01J037/30 ;
U.S. Cl.
CPC ...
Abstract

An electron microscopeis adapted to enable spectroscopic analysis of a sample. A parabolic mirrorhas a central aperturethrough which the electron beam can pass. The mirrorfocuses laser illumination from a transverse optical pathonto the sample, and collects Raman and/or other scattered light, passing it back to an optical system. The mirroris retractable (within the vacuum of the electron microscope) by a sliding arm assembly


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