The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2005
Filed:
Dec. 13, 1999
Sion Quinlan, Goring on Thame, GB;
Sion Quinlan, Goring on Thame, GB;
LSI Logic Corporation, Milpitas, CA (US);
Abstract
A method of testing or calibrating analog to digital converters in a digital test environment comprising: providing a phase lock loop having a voltage controlled oscillator, and calibrating the phase lock loop in terms of the relation between the input voltage to the voltage controlled oscillator and the frequency of the loop; providing in the phase lock loop a digital comparison means providing an output to a charge pumping means which provides a voltage to the input of a voltage controlled oscillator; applying a predetermined code to one input of the digital comparison means and applying the output code of an analog to digital converter to a further input of the digital comparison means, and applying the input voltage to the voltage controlled oscillator to the input of the analog to digital converter; and when equality is established between the digital codes applied to the inputs of the digital comparison means, and the frequency of the phase lock loop is constant, measuring the frequency of the phase lock loop.