The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2005

Filed:

Sep. 27, 2001
Applicants:

Van Hoa Lee, Cedar Park, TX (US);

Charles Andrew Mclaughlin, Round Rock, TX (US);

Stephen Joseph Schwinn, Lakeville, MN (US);

Inventors:

Van Hoa Lee, Cedar Park, TX (US);

Charles Andrew McLaughlin, Round Rock, TX (US);

Stephen Joseph Schwinn, Lakeville, MN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F011/00 ;
U.S. Cl.
CPC ...
Abstract

A method, apparatus, and computer instructions for testing hardware in a data processing system having multiple partitions. A monitor process in a first partition assigned to a first processor is initialized. A random code generation process in a second partition associated with a second processor is initialized. The random code generation process generates instructions and executes the instructions to test the second processor. The monitor process monitors the random code generation process and resets the second processor if the random code generation process fails.


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