The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Sep. 09, 2002
Masaru Sanada, Tokyo, JP;
Masaru Sanada, Tokyo, JP;
NEC Electronics Corporation, Kanagawa, JP;
Abstract
A diagnostic system for finding failures in an integrated circuit includes a scan-chain circuit which is comprised of a plurality of flip-flop circuits electrically connected in series to one another and outputs logic data stored in the flip-flop circuits on receipt of a control signal. The diagnostic system includes (a) a first identifier which identifies a circuit group which is suspected to have failure therein, among circuit groups surrounded by the scan-chain circuit, (b) a first extractor which extracts logic data of an input terminal of the circuit group having been identified by the first identifier, (c) a second extractor which extracts logic data to be input into each of fundamental logic circuits constituting the circuit group, and (d) a second identifier which identifies a fundamental logic circuit suspected to have failure therein by comparing the logic data having been extracted by the second extractor, to one another.