The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2005

Filed:

Mar. 26, 2001
Applicants:

Mitsuhiko Yoshimura, Yokohama, JP;

Yuichi Yagawa, Yokohama, JP;

Shigetoshi Hayashi, Fujisawa, JP;

Norifumi Nishikawa, Machida, JP;

Keiichiro Inaba, Musashino, JP;

Inventors:

Mitsuhiko Yoshimura, Yokohama, JP;

Yuichi Yagawa, Yokohama, JP;

Shigetoshi Hayashi, Fujisawa, JP;

Norifumi Nishikawa, Machida, JP;

Keiichiro Inaba, Musashino, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F017/30 ;
U.S. Cl.
CPC ...
Abstract

The present invention provides techniques for answering a user's query to a database system. An embodiment provides a database querying method in which a first data item is obtained from a Data Base Management System (DBMS) database table in response to a query request. A second data item is obtained by referencing a DBMS updated log file, having log data associated with the first data item, for example a timestamp. The first and second data items are then integrated and returned as an integration result to the query request. In one embodiment the first and second data items are integrated in a virtual table in accordance with a predetermined business rule.


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