The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2005

Filed:

Dec. 19, 2002
Applicants:

Koichi Shimizu, Kawasaki, JP;

Akira Ueda, Kawasaki, JP;

Kenichiro Aoki, Kawasaki, JP;

Inventors:

Koichi Shimizu, Kawasaki, JP;

Akira Ueda, Kawasaki, JP;

Kenichiro Aoki, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F015/00 ;
U.S. Cl.
CPC ...
Abstract

An analytical mesh preparation apparatus, an analytical mesh preparation method and an analytical mesh preparation program are provided which are capable of preparing a mesh in such a manner as to improve calculation accuracy and shorten the calculation time as well. Upon preparation of an analytical mesh by arranging grid lines in an analytical area to analyze prescribed physical quantities for an object composed of a plurality of parts, grid lines are first arranged at corners of the parts, and the intervals between adjacent ones of the grid lines are calculated. Based on the calculation result, the grid lines to be removed are determined, as a result of which the grid lines thus determined are removed. The shapes or sizes of the parts are changed in accordance with the removal of the grid lines.


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