The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Jul. 18, 2002
Applicants:
Chin-lung Ting, Tainan, TW;
Chun-bin Wen, Tainan, TW;
Inventors:
Chin-Lung Ting, Tainan, TW;
Chun-Bin Wen, Tainan, TW;
Assignee:
Chi Mei Optoelectronics Corporation, Tainan, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F019/00 ; H01L021/66 ;
U.S. Cl.
CPC ...
Abstract
A method for classifying a substrate first provides the substrate and its corresponding inspection map. Then, a database having a plurality of specification data is provided. After that, the inspection map is compared with each of the specification data so as to find the specification data coinciding with the inspection map. Finally, the substrate is defined according to the layout of active areas coinciding with the inspection map, and then the substrate is classified and stored.