The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Feb. 21, 2002
Hung-jen Tseng, Hsin-Chu Hsien, TW;
Chi-mou Chao, Hsin-Chu Hsien, TW;
Chih-yu Fan, Hsin-Chu Hsien, TW;
Hung-Jen Tseng, Hsin-Chu Hsien, TW;
Chi-Mou Chao, Hsin-Chu Hsien, TW;
Chih-Yu Fan, Hsin-Chu Hsien, TW;
Mediatek Incorporation, Hsin-Chu Hsien, TW;
Abstract
An optimal power calibration (OPC) method calibrates writing power for an optical disc. The optical disc includes a power calibration area, with a plurality of counting units and test blocks. The OPC method includes generating a plurality of first power levels by using an indicated power, selecting a plurality of second power levels from the first power levels, recording test data onto test blocks with the second power levels, reading the test blocks, and generating data signals and first beta values. The method further includes generating estimated optimal power by a calculating algorithm, generating a plurality of third power levels by using the estimated optimal power, recording test data onto test blocks with the third power levels, reading the test blocks, and generating data signals and second beta values. Optimal power is calculated by using the estimated optimal power, the first beta values, and the second beta values.