The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Sep. 26, 2002
Applicants:
Jochen Bloedorn, Giessen, DE;
Helmut Ruehl, Giessen, DE;
Inventors:
Jochen Bloedorn, Giessen, DE;
Helmut Ruehl, Giessen, DE;
Assignee:
Leica Microsystems Wetzlar GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B021/06 ;
U.S. Cl.
CPC ...
Abstract
The invention concerns a microscope having an image sensor () for recording the microscope images. The specimen () to be examined can be scanned by means of a stop () in the beam path of the illumination unit and a positioning unit which moves the specimen () or the stop (). Opening the stop () or removing it from the beam path permits the entire image to be scanned with the image sensor ().