The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Jun. 30, 2003
Applicants:
Joseph C. Marron, Ann Harbor, MI (US);
Dean Faklis, Bloomfield, NY (US);
Inventors:
Joseph C. Marron, Ann Harbor, MI (US);
Dean Faklis, Bloomfield, NY (US);
Assignee:
Lightgage, Inc., Bloomfield, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B009/02 ;
U.S. Cl.
CPC ...
Abstract
An expanding measuring beam is inserted into a cavity of a frequency-scanning interferometer. The expanding measuring beam encounters non-specular (diffuse) reference and object surfaces so that the reflected light can be imaged with an imaging system of reduced dimension. The compact interferometer is adaptable to a variety of applications. For example, the compact interferometer can be incorporated into a sensor of a multi-stage measuring instrument or into a handheld imager.