The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2005

Filed:

Nov. 26, 2002
Applicants:

Malvin C. Teich, Boston, MA (US);

Bahaa E A. Saleh, Lexington, MA (US);

Alexander V. Sergienko, Boston, MA (US);

Ayman F. Abouraddy, Boston, MA (US);

Magued B. Nasr, Allston, MA (US);

Inventors:

Malvin C. Teich, Boston, MA (US);

Bahaa E A. Saleh, Lexington, MA (US);

Alexander V. Sergienko, Boston, MA (US);

Ayman F. Abouraddy, Boston, MA (US);

Magued B. Nasr, Allston, MA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B009/02 ;
U.S. Cl.
CPC ...
Abstract

The disclosed Quantum Optical Coherence Tomography apparatus and method includes a source of quantum entangled photons and a quantum interference device. The pair of entangled photons is divided into two beams, one of which illuminates a semi-reflective object and the second of which is reflected from a variable optical time-delay element (VTE). The VTE is scanned and the quantum interference in the QID is recorded to build up a reflectance profile of the object. A real scanning produces a full tomographic reflectance image. A method of processing the data to eliminate the effects of optical dispersion is disclosed.


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