The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Jun. 18, 2003
Seiichiro Mori, Tochigi, JP;
Takeshi Yamawaki, Tokyo, JP;
Seiichiro Mori, Tochigi, JP;
Takeshi Yamawaki, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An incident optical system introduces a plurality of laser beams to an optical deflector from within a scanning range, the width of the plurality of laser beams being larger than the width of a deflection surface of the optical deflector in a main scanning direction. Principal rays of the plurality of laser beams, separated by a predetermined angle, cross each other near the deflection surface in a main scanning cross-section. A scanning optical device satisfies the expression Δθ<(4π/N)×(1−ρ), where Δθ represents the largest angle between principal rays of two of the plurality of laser beams, N represents the number of deflection surfaces of the optical deflector, and ρ represents the scanning efficiency of the deflection surface, which is the ratio of an image forming range to the theoretical maximum scanning width on the deflection surface of the optical deflector.