The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Jul. 18, 2003
Hisashi Nagata, Nara, JP;
Takayuki Shimada, Yamatokoriyama, JP;
Yasunobu Akebi, Yamabe-gun, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
Data-line inspection-use switching elements for switching the supply of inspection-use display signals are individually connected to a plurality of data lines, and scanning-line inspection-use switching elements for switching the supply of inspection-use scanning signals are individually connected to a plurality of scanning lines. The data-line inspection-use switching elements connected to the data lines are connected to an inspection-use display signal line for supplying the inspection-use display signals to the data-line inspection-use switching elements. Meanwhile, three data-line inspection-use control signal lines for inputting control signals for switching on/off the data-line inspection-use switching elements are provided in correspondence with the display colors. It is thus possible to provide an active-matrix-type liquid crystal display panel which enables an inspection with higher accuracy by performing a monochromatic display, without increasing unnecessary regions and increasing processes and defective units by cutting such regions, and enables the prevention of the outflow of the defective units and the reduction of the production cost.