The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Nov. 30, 2000
Ian M. Williams, Sunnyvale, CA (US);
Ian M. Williams, Sunnyvale, CA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
The present invention provides an apparatus, system, and method for performing interference checking of the design in a project, component or part thereof to a designer, engineer, team of designers, or a team of engineers. In one embodiment, the present invention is comprised of a texture generating apparatus adapted to provide proximity analysis of objects in a design by dynamically generating a texture visually indicative of the spatial relationship between the modeled objects. In this embodiment, the texture generating apparatus is further comprised of a processing element. The processing element is adapted to perform the calculations of the interference check. The texture generating apparatus is further comprising a texture generating element. The texture generating element is adapted to provide the texture on which the interference check is based. The texture generating apparatus is further comprised a rendering element. The rendering element is adapted to provide the rendering of the texture onto the object in a design.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile