The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Nov. 05, 2003
Applicants:
Jon S. Martens, San Jose, CA (US);
David V. Judge, Temple, NH (US);
Jimmy A. Bigelow, Castroville, CA (US);
Inventors:
Jon S. Martens, San Jose, CA (US);
David V. Judge, Temple, NH (US);
Jimmy A. Bigelow, Castroville, CA (US);
Assignee:
Anritsu Company, Morgan Hill, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R015/12 ;
U.S. Cl.
CPC ...
Abstract
Techniques are provided for performing full N-port calibrations in an environment in which a test set is used to connect an N-port DUT to an M-port VNA, where N>M. Techniques for incorporating port impedances as part of a calibration sequence are provided. Also provided are techniques for using sequential characterization and de-embedding to generate virtual calibrations that are then used in a renormalization process.