The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2005

Filed:

Nov. 13, 2003
Applicants:

Berthold Kiefer, Erlangen, DE;

Robert Krieg, Nuernberg, DE;

Inventors:

Berthold Kiefer, Erlangen, DE;

Robert Krieg, Nuernberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V003/00 ;
U.S. Cl.
CPC ...
Abstract

In a processing system for an MRT apparatus, a user interface as presented that permits an operator to undertake a graphical measurement planning based on already-recorded, corrected MRT overview images, the correction having been carried out by the processing system on the basis of stored data accessible by the processing system relating to non-linearities of the gradient system of the MRT apparatus being used. The processor system, in the user interface, automatically graphically demarcates the area of the corrected MRT overview image in which a positioning of additional slices to be measured will lead to a deviation of the desired slices, from the actual slices in a subsequent scan from the ear of the corrected MRT overview image in which a positioning of additional slices to be measured will not lead to such a deviation of the desired slices.


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