The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Feb. 27, 2004
Shoichi Kajiwara, Moriguchi, JP;
Akihiro Ozaki, Neyagawa, JP;
Koichi Ogawa, Hirakata, JP;
Yoshio Koyanagi, Ebina, JP;
Yoshitaka Asayama, Ogasa-gun, JP;
Yutaka Saito, Nomi-gun, JP;
Shoichi Kajiwara, Moriguchi, JP;
Akihiro Ozaki, Neyagawa, JP;
Koichi Ogawa, Hirakata, JP;
Yoshio Koyanagi, Ebina, JP;
Yoshitaka Asayama, Ogasa-gun, JP;
Yutaka Saito, Nomi-gun, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
An electromagnetic wave measuring apparatus includes a loop probe section having loop probes whose loop planes are placed so as to be perpendicular to each other, and each loop probe is placed so that its magnetic field detection space is not interfered with by other loop probes. If the loop probe section is placed at measurement position coordinates x, y, it detects a magnetic field component at the measurement position coordinates x, y, which is parallel to an XY plane, and a magnetic field component in a Z-axis direction at measurement position coordinates x, y, and repeats measurement by pitch p in a positive Y-axis direction. By calculating the root sum square of the detection results at each measurement position coordinate, a three-dimensional magnetic field level of an object to be measured can be obtained at each measurement position coordinate as electromagnetic field distribution with high-precision.