The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Oct. 31, 2002
Ling Jian Meng, Ann Arbor, MI (US);
Neal H. Clinthorne, Ann Arbor, MI (US);
W. Leslie Rogers, Ann Arbor, MI (US);
David K. Wehe, Ann Arbor, MI (US);
Ling Jian Meng, Ann Arbor, MI (US);
Neal H. Clinthorne, Ann Arbor, MI (US);
W. Leslie Rogers, Ann Arbor, MI (US);
David K. Wehe, Ann Arbor, MI (US);
The Regents of the University of Michigan, Ann Arbor, MI (US);
Abstract
Method and system for generating an image of the radiation density of a source of photons located in an object wherein Compton scattering and non-Compton scattering events are detected and contained within data used for image reconstruction. The system includes a multiple pinhole collimator, a position sensitive scintillation detector as used in standard Gamma cameras, and a silicon pad detector array inserted between the collimator and the scintillation detector. The problem of multiplexing, normally associated with multiple pinhole systems, is reduced by using the extra information from the detected Compton scattering events. For properly selected pinhole spacing, this leads to a significantly improved image quality. A valuable enhancement can be achieved when adding only a small fraction of gamma rays with reduced angular ambiguity. The system does not require a highly optimized Compton camera behind the collimator.