The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2005

Filed:

May. 09, 2001
Applicants:

Tak Kin Chu, Bethesda, MD (US);

Francisco Santiago, Fredericksburg, VA (US);

Kevin A. Boulais, Waldorf, MD (US);

Inventors:

Tak Kin Chu, Bethesda, MD (US);

Francisco Santiago, Fredericksburg, VA (US);

Kevin A. Boulais, Waldorf, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L021/44 ; H01L021/4763 ;
U.S. Cl.
CPC ...
Abstract

An epitaxial barrier material provides not only a unique growth medium for growing single crystal structures of elemental metal thereon, but also provides an effective diffusion barrier at extremely thin thicknesses against migration of atoms from the metallization layer into an adjacent semiconductor substrate or low dielectric insulation layer. This invention is particularly advantageous for forming single crystal, transition metal conductor lines, contacts, filled trenches, and/or via plugs, and especially conductor structures based on transition metals of copper, silver, gold, or platinum. These metals are highly attractive for interconnect strategies on account of there respective low resistivity and high reliability characteristics. Processes for making the barrier film in a semiconductor device are also covered. The capability to use copper interconnect strategies coupled with the proviso of an extremely thin barrier film makes possible a significant increase in the component density and a corresponding reduction in the number of layers in large scale integrated circuits, as well as improved performance.


Find Patent Forward Citations

Loading…