The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Apr. 14, 2000
Reinhard Bredehorst, Hamburg, DE;
Rainer Hintsche, Berlin, DE;
Rene Seitz, Itzehoe, DE;
Walter Gumbrecht, Herzogenaurach, DE;
Reinhard Bredehorst, Hamburg, DE;
Rainer Hintsche, Berlin, DE;
Rene Seitz, Itzehoe, DE;
Walter Gumbrecht, Herzogenaurach, DE;
Abstract
The invention relates to a method for producing a detection system for detecting different analytes in a sample, characterised by the following steps: providing a planar or essentially planar substrate which has sensors for chemically, optically or electrically detecting the analytes; applying an already microstructured layer to the substrate or applying a continuous layer to the substrate and microstructuring said layer, the layer being applied in such a way in either case that the areas of the substrate that are separated from each other are not covered by the layer, the layer and substrate being sealingly interconnected at least around the uncovered areas; bringing at least some of the uncovered areas into contact with at least one liquid containing catcher molecules, in such a way that said catcher molecules are able to adhere or bond to the surface of the substrate and/or on the surface of the sensors; removing the non-adhering constituents of the liquid and removing the microstructured layer or parts thereof.