The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Nov. 08, 2002
Eric D. Carlson, Cupertino, CA (US);
Damian A. Hajduk, San Jose, CA (US);
Leonid Matsiev, San Jose, CA (US);
Adam Safir, Berkeley, CA (US);
Paul Mansky, San Francisco, CA (US);
Eric D. Carlson, Cupertino, CA (US);
Damian A. Hajduk, San Jose, CA (US);
Leonid Matsiev, San Jose, CA (US);
Adam Safir, Berkeley, CA (US);
Paul Mansky, San Francisco, CA (US);
Symyx Technologies, Inc., Santa Clara, CA (US);
Abstract
A rapid throughput method for the preparation, analysis or both of libraries of material samples is provided. According to the method, a plurality of samples is provided. Providing the plurality of samples can include a variety of sample formation techniques including, but not limited to, extruding, milling, compression preparation, rotary mixing, microcentrifugation, molding and casting. Preferably, the samples are solidified into a near net shape configuration appropriate for testing of properties or characteristics of the samples.