The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2005

Filed:

Jul. 29, 2003
Applicants:

Andrew Gattuso, Phoenix, AZ (US);

Sung Pei Hou, Tu-Chen, TW;

Jung-jang Chu, Tu-Chen, TW;

Hsiu-yuan Hsu, Tu-Chen, TW;

Inventors:

Andrew Gattuso, Phoenix, AZ (US);

Sung Pei Hou, Tu-Chen, TW;

Jung-Jang Chu, Tu-Chen, TW;

Hsiu-Yuan Hsu, Tu-Chen, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R004/50 ;
U.S. Cl.
CPC ...
Abstract

A connector assembly () includes a test connector () for testing of an IC package (), an actuation system () mounted on the test connector, and a supporting member () engaged with the actuation system. The supporting member includes a frame () and a plurality of columns () for supporting the frame. The frame defines an opening () in a center thereof, a pair of opposite channels (), and two receiving holes (). The actuation system includes a pair of first cams () received in the corresponding channels of the frame, a pair of spindles () received in the corresponding receiving holes of the frame, an actuation lever () connected between the first cams, and a pair of second cams () integrally connected to the spindles. The actuation system can exert a continuous force on the test connector, thereby the testing of the IC package is effective.


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