The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Jun. 04, 2003
Robert D. Fiete, Fairport, NY (US);
Theodore A. Tantalo, Rochester, NY (US);
Robert D. Fiete, Fairport, NY (US);
Theodore A. Tantalo, Rochester, NY (US);
ITT Manufacturing Enterprises, Inc., Wilmington, DE (US);
Abstract
In a method for imaging using multiple apertures, the present invention uses a wavefront sensor, a phase sensor, and an image processor to construct a high-resolution image without using complex relay optics. A wavefront sensor collects information that allows the wavefront from each aperture to be reconstructed and a phase sensor collects information regarding the relative phase difference between the apertures. An image processor uses the information collected from the phase sensor to correct the phase differences between the apertures, reconstruct the wavefronts from the wavefront sensor data, then coherently sums the wavefronts from each aperture to form a high-resolution image that corresponds to a synthesized aperture that is larger than any of the individual apertures.