The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Jun. 26, 2003
Brett A. Davis, Cooparoo, AU;
Michael J. Collins, Mt. Nebo, AU;
Daoud R. Iskander, Hawthorne, AU;
Jeffrey H. Roffman, Jacksonville, FL (US);
Denwood F. Ross, Iii, Jacksonville, FL (US);
Brett A. Davis, Cooparoo, AU;
Michael J. Collins, Mt. Nebo, AU;
Daoud R. Iskander, Hawthorne, AU;
Jeffrey H. Roffman, Jacksonville, FL (US);
Denwood F. Ross, III, Jacksonville, FL (US);
Johnson & Johnson Vision Cars, Inc., Jacksonville, FL (US);
Abstract
An apparatus and method for measuring wavefront aberrations. The apparatus comprises a reflecting device for reflecting selected portions of the wavefront, an imaging device for capturing information related to the selected portions, and a processor for calculating aberrations of the wavefront from the captured information. The method comprises reflecting selected portions of a wavefront onto the imaging device, capturing information related to the selected portions, and processing the captured information to derive the aberrations.