The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Apr. 02, 2003
Ulrich Esser, Gossau, CH;
Thomas Hütter, Niederrohrdorf, CH;
Ulrich Esser, Gossau, CH;
Thomas Hütter, Niederrohrdorf, CH;
Mettler-Toledo GmbH, Greifensee, CH;
Abstract
In a dynamic mechanical analysis, a test specimen is coupled to an excitation device by a holder device. An excitation force made up of a static pre-tensioning force component and a time-variable force component is applied to the test specimen, and a deformation of the test specimen is measured by one or more displacement sensors. In a test phase an excitation force is applied to the test specimen, while at least one decision parameter is determined. The decision parameter is indicative of a degree of slack in the coupling of the test specimen. Based on the comparison between the decision parameter and at least one reference value it is determined whether or not the test specimen is coupled to the excitation device in a completely slack-free state, so that any measured physical values will not be subjected to errors caused by an insufficient amount of the pre-tensioning force.