The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2005

Filed:

Feb. 14, 2002
Applicants:

Claes Hedberg, Karlskrona, SE;

Alexander Sutin, Hoboken, NJ (US);

Paul A. Johnson, Santa Fe, NM (US);

Inventors:

Claes Hedberg, Karlskrona, SE;

Alexander Sutin, Hoboken, NJ (US);

Paul A. Johnson, Santa Fe, NM (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M007/02 ; G01M007/06 ; G01N029/04 ; G01N025/72 ; G01N029/12 ;
U.S. Cl.
CPC ...
Abstract

In a method of detecting damage in materials or objects () the material or object is physically influenced to produce a physical change of the material or object inducing transient slow dynamics in case of damages in the material or object. Slow dynamics induced material elastic modulus changes are detected as indication of damages of the material or object. In a device for non-destructive detection of damage in materials or objects (), an impact source () is provided to impact the material or object to physically influence the material or object to produce a physical change of the material or object inducing transient slow dynamics in case of damages in the material or object. A detector () is provided to detect by said slow dynamics induced material elastic modulus changes as indications of damages of the material or object.


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