The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2005

Filed:

Nov. 27, 2001
Applicants:

Albert Man, Richmond Hill, CA;

Roy Schoonover, Mississauga, CA;

Inventors:

Albert Man, Richmond Hill, CA;

Roy Schoonover, Mississauga, CA;

Assignee:

ATI Technologies, Inc., Ontario, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C029/00 ;
U.S. Cl.
CPC ...
Abstract

A system and method for testing multiple components using a single host system is shown and described. A host system with a single advanced graphics port (AGP) is used to generate commands of a test routine to test a particular type of AGP processing component. A test fixture interfaces to the AGP port of the host system and provides the commands to each of a plurality of test components. The test components process the commands concurrently, generating results. The test fixture receives each of the results in turn and provides the results to the host system, allowing the host system to determine if the test components are functioning within particular parameters. The test fixture provides an interface to allow several test components to be tested as AGP master devices, over a single AGP port on the host system.


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