The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2005

Filed:

Jun. 25, 2001
Applicant:

David L. Keefe, Newport, RI (US);

Inventor:

David L. Keefe, Newport, RI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K009/00 ;
U.S. Cl.
CPC ...
Abstract

The developmental potential of a mammalian oocyte for successful implantation is evaluated by producing a plurality of intensity images of the oocyte using polarized light optics, and calculating a retardance image with a sensitivity of 3 nm or less. The presence, location and morphological characteristics of a meiotic spindle in the oocyte can then be determined based on the spindle structure in the retardance image, and the developmental potential of the oocyte can be evaluated.


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