The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6879708 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 12, 2005

Filed:

May. 24, 2001
Applicants:

Mark P. Wernet, Sheffield Village, OH (US);

Amy F. Mielke, Cleveland, OH (US);

Jaikrishnan R. Kadambi, Richmond Heights, OH (US);

Inventors:

Mark P. Wernet, Sheffield Village, OH (US);

Amy F. Mielke, Cleveland, OH (US);

Jaikrishnan R. Kadambi, Richmond Heights, OH (US);

Assignee:

Case Western Reserve University, Cleveland, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K009/00 ;
U.S. Cl.
CPC ...
Abstract

A method for determining a mass flux of an entrained phase in a planar two-phase flow records images of particles in the two-phase flow. Respective sizes of the particles (the entrained phase) are determined as a function of a separation between spots identified on the particle images. Respective velocities of the particles are determined. The mass flux of the entrained phase is determined as a function of the size and velocity of the particles.


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Wernet, Mark. (2005). Planar particle/droplet size measurement technique using digital particle image velocimetry image data (U.S. Patent No. 6879708). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6879708

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