The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2005
Filed:
Feb. 07, 2002
Max Shurgalin, Arlington, MA (US);
Yoel Fink, Cambridge, MA (US);
Steven G. Johnson, Cambridge, MA (US);
Mihai Ibanescu, Cambridge, MA (US);
Max Shurgalin, Arlington, MA (US);
Yoel Fink, Cambridge, MA (US);
Steven G. Johnson, Cambridge, MA (US);
Mihai Ibanescu, Cambridge, MA (US);
OmniGuide Communications, Cambridge, MA (US);
Abstract
Techniques for monitoring the quality (e.g., optical and mechanical properties) in optical waveguides (e.g., photonic crystal fibers) are disclosed. Additionally, techniques for detecting and localizing defects in the waveguides are also described. Pulses of light are launched into one end of an optical waveguide. The amount of light scattered out of the same end of the waveguide (i.e., a backscattered or reflected signal) is monitored at certain wavelengths specific to the spectral characteristics of the waveguide. Transmission characteristics and defect localization can be determined from the backscattered signal.