The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2005
Filed:
Dec. 22, 2003
Isaac Kantorovich, Chestnut Hill, MA (US);
Christopher Lee Houghton, Westborough, MA (US);
James J. St. Laurent, Oakham, MA (US);
Isaac Kantorovich, Chestnut Hill, MA (US);
Christopher Lee Houghton, Westborough, MA (US);
James J. St. Laurent, Oakham, MA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
Disclosed are various systems, methods, and programs embodied in computer readable mediums for measuring current in a central processor unit (CPU) package. To measure the current, a voltage V(t) is determined in situ across at a power input of a die in the CPU package while running a computer process on the die. Then, the Fourier transform of the voltage F(V(t)) is calculated from the voltage V(t). The current at the power input of the die in the frequency domain (F(I(t))) can then be calculated from the voltage F(V(t)) and impedance Z, where the impedance Zcomprises an impedance of a power supply loop coupled to the power input as a function of frequency. Finally, the current I(t) at the power input of the die is determined in the time domain by calculating the inverse Fourier transform of the current in the frequency domain F(I(t)).