The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2005
Filed:
Oct. 06, 2003
Victor G Stimpson, Avening, GB;
Jon P Fuge, Bristol, GB;
William K Davies, Bristol, GB;
Norman J Leete, Uley, GB;
Colin T Bell, Berkeley, GB;
Victor G Stimpson, Avening, GB;
Jon P Fuge, Bristol, GB;
William K Davies, Bristol, GB;
Norman J Leete, Uley, GB;
Colin T Bell, Berkeley, GB;
Renishaw PLC, Gloucestershire, GB;
Abstract
The present invention teaches a method and apparatus for making measurement of an object on a machine, such as a machine tool, using an optical measuring apparatus which includes a light source for generating a beam of light which is incident on a detector. A detection signal is generated within the detector each time the beam is interrupted. The duration and/or frequency of the detection signals are evaluated and an output signal is emitted from the detection only if a further detection signal is present within the detector in a specified time interval from the generation of an earlier detection signal.