The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2005
Filed:
Jun. 03, 2002
Christophe Martinez, Grenoble, FR;
Pierre Ferdinand, Houilles, FR;
Christophe Martinez, Grenoble, FR;
Pierre Ferdinand, Houilles, FR;
Commissariat a l'Energie Atomique, Paris, FR;
Abstract
A differential measurement system using pairs of Bragg gratings including at least one optical sensor having two Bragg gratings in two optical waveguides and having sensitivities adjusted so that respective spectra of the two gratings have a relative spectral shift dependent on a parameter or parameters to be measured. The system also includes an optical source to supply light to the two optical waveguides to interrogate them, a mechanism enabling light to pass successively through the two Bragg gratings of the same sensor, photodetectors to measure the power level of light having passed only through one of the two optical waveguides and the power level of light having passed successively through the two optical waveguides, and a processor to process the power levels and supply values of the parameter or parameters measured. The system is applicable in particular to measurements of temperatures, stresses, and pressures.