The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2005

Filed:

Mar. 23, 2004
Applicant:

Tomohide Takami, Tokyo, 143-0025, JP;

Inventor:

Tomohide Takami, Tokyo, 143-0025, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03C007/33 ;
U.S. Cl.
CPC ...
Abstract

An image analysis deviceis equipped with the photoreceptive meansthat optically acquires diffraction pattern A that appears on the fluorescent screenin order to obtain the diffraction pattern resulting from reflection high-energy electron diffraction, and the halation-prevention filterprovided so as to transmit the visible light emitted from the diffraction pattern A of the fluorescent screen, along the light path connecting the photoreceptive meansand the fluorescent screen. Also, the filteris varied so that the transmittance of the visible light transmitted through the filteris minimum at the filter center and increases with the distance from the center.


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