The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2005

Filed:

Apr. 01, 2003
Applicants:

Indradeep Ghosh, San Jose, CA (US);

Koichiro Takayama, Cupertino, CA (US);

Liang Zhang, Blacksburg, VA (US);

Inventors:

Indradeep Ghosh, San Jose, CA (US);

Koichiro Takayama, Cupertino, CA (US);

Liang Zhang, Blacksburg, VA (US);

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F017/50 ;
U.S. Cl.
CPC ...
Abstract

Evaluating a validation vector includes receiving a network having nodes and a target set that includes one or more nodes of the network. The following steps are repeated until the nodes of the target set have been selected. A node is selected from the target set, and a tag is assigned to the node, where the tag represents an error of a value of a variable corresponding to the node. A test environment specifying a propagation path from an input, through the node, and to an output is generated. The test environment is translated into a validation vector, and the tag is propagated to the output according to the validation vector. After repeating the steps, coverage for the validation vectors is determined in accordance with the propagation to evaluate the one or more validation vectors.


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