The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2005
Filed:
Jul. 19, 2001
Chandrasekhar Thyamagondlu Srinivasaiah, San Jose, CA (US);
Udupi Harisharan, Cupertino, CA (US);
Chidambaram Ramaswamy, Santa Clara, CA (US);
Chandrasekhar Thyamagondlu Srinivasaiah, San Jose, CA (US);
Udupi Harisharan, Cupertino, CA (US);
Chidambaram Ramaswamy, Santa Clara, CA (US);
Cisco Technology, Inc., San Jose, CA (US);
Abstract
An apparatus and a method for testing Alternating Current (AC) coupled interconnects of a circuit using boundary scan methodology are disclosed. A Boundary Scan Cell (BSC) of a transmitting Integrated Circuit (IC) generates an AC signal based on a value of the BSC of the transmitting IC and a reference clock. A Sync Pulse cell at the receiving IC generates a sync pulse signal to the BSC of the receiving IC. The BSC of the receiving IC captures a default phase of the AC signal in relation to the sync pulse signal and also captures a phase of a source of input signal. The BSC of the receiving IC then compares the phase of a source of input signal with the phase of said AC signal in relation to the phase captured at the snyc pulse signal and sends out an output signal based on the comparison.