The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2005

Filed:

Oct. 16, 2000
Applicants:

LI Deng, Redmond, WA (US);

Xuedong Huang, Woodinville, WA (US);

Michael D. Plumpe, Seattle, WA (US);

Inventors:

Li Deng, Redmond, WA (US);

Xuedong Huang, Woodinville, WA (US);

Michael D. Plumpe, Seattle, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10L015/06 ; G10L015/20 ;
U.S. Cl.
CPC ...
Abstract

A method and apparatus for training and using a pattern recognition model are provided. Under the invention, additive noise that matches noise expected in a test signal is included in a training signal. The noisy training signal is passed through one or more noise reduction techniques to produce pseudo-clean training data. The pseudo-clean training data is used to train the pattern recognition model. When the test signal is received, it is passed through the same noise reduction techniques used on the noisy training signal. This produces pseudo-clean test data, which is applied to the pattern recognition model. Under one embodiment, sets of training data are produced with each set containing a different type of noise.


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