The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2005
Filed:
Apr. 06, 2001
Makoto Suzuki, Hamamatsu, JP;
Hiroshige Mori, Hamamatsu, JP;
Tomikazu Yonezawa, Hamamatsu, JP;
Hamamatsu Photonics K.K., Shizuoka, JP;
Abstract
The X-ray inspection systemcomprises an X-ray electron conversion facefor converting an entered X-ray image transmitted through the measurement object into an electronic image, an output fluorescent facefor emitting fluorescence when an electronic image is entered, and deflecting meanswhich is installed between the X-ray electron conversion faceand output fluorescent face, wherein the electronic image which was entered and converted at the X-ray electron conversion faceis converged into a predetermined area on the output fluorescent faceby the deflecting meansso as to make the X-ray fluoroscopic image of the moving measurement object stand still on the output fluorescent face. By this, the image of the measurement object can be captured during the time when the X-ray fluorescence image is standing still, so sensitivity can be secured while increasing the resolution.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile