The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2005

Filed:

May. 30, 2003
Applicants:

Christopher B. Svec, Palatine, IL (US);

Christopher L. Kauffman, Lake Zurich, IL (US);

Hao C. Tran, Gurnee, IL (US);

Inventors:

Christopher B. Svec, Palatine, IL (US);

Christopher L. Kauffman, Lake Zurich, IL (US);

Hao C. Tran, Gurnee, IL (US);

Assignee:

Northrop Grumman Corporation, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B026/00 ; G02B026/08 ; G02B006/42 ;
U.S. Cl.
CPC ...
Abstract

Apparatus which directs light rays from a distant target area scene to a plurality of wavelength detection systems without wavelength degradation. A reflective afocal telescope directs the light rays from the scene to a MEMS mirror array which redirects the rays to selected ones of the detection systems. The MEMS mirror array has individually controllable mirror elements which are driven to predetermined angular orientations to accomplish the light ray redirection. Outputs from the detection systems may be provide to a computer for analysis and/or viewing.


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