The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2005
Filed:
Oct. 31, 2002
Jochen Barth, Oberschleissheim, DE;
Michael Assel, Dachau, DE;
Yvonne Polin, Weil der Stadt, DE;
LFK-Lenkflugkoerpersysteme GmbH, Unterschleissheim, DE;
Abstract
In a process for automatically determining the modulation transfer function (MTF) of a focal plane array (FPA) cameras, a test grid is used to generate a beat whose amplitude corresponds to that of the grid image to be measured, without the sampling MTF. (The image of the test grid has a spatial frequency in the detector plane that is detuned with respect to the Nyquist frequency of the detector array. The test grid covers a range of at least half a beat period, and then, regardless of the actual phase position, the modulation amplitude is determined therefrom. Comparative MTF measurements are thereby permitted without the influence of the sampling effect of an FPA, and particularly the MTF measurement in real time suitable for the application to moving images.