The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2005
Filed:
May. 05, 2003
Jörg Vollrath, Olching, DE;
Jörg Vollrath, Olching, DE;
Infineon Technologies AG, Munich, DE;
Abstract
A test system and a method for testing an integrated circuit determines the synchronization of the integrated circuit by a current measurement rather than conventionally in the time domain. The present principle is based on the insight that the current consumption of a DUT given simultaneous driving of data on a common data channel from the DUT and from the tester is dependent on a superposition of both signals. Accordingly, highly accurate conclusions about the phase angle of the two signals with respect to one another can be drawn from the present current consumption. The principle presented can be applied particularly to DDR-SDRAMs with a low outlay.