The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2005
Filed:
Oct. 15, 2002
Stefan Dankowski, Haar-Ottendichl, DE;
Alexander Benedix, München, DE;
Reinhard Düregger, Poing, DE;
Wolfgang Ruf, Friedberg, DE;
Stefan Dankowski, Haar-Ottendichl, DE;
Alexander Benedix, München, DE;
Reinhard Düregger, Poing, DE;
Wolfgang Ruf, Friedberg, DE;
Infineon Technologies AG, Munich, DE;
Abstract
To be able to test a plurality of identical semiconductor circuit devices in a particularly rapid yet reliable manner, a test method includes carrying out the tests in parallel and substantially simultaneously on the plurality of semiconductor circuit devices and driver lines—used in the process—of a test device to the semiconductor circuit devices simultaneously and jointly for all the semiconductor circuit devices. In such a case, test results are read from a plurality of input/output channels in compressed form. Furthermore, as an alternative or in addition thereto, the semiconductor circuit devices to be tested are disposed and connected up in at least one stack.