The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2005
Filed:
Jun. 30, 2003
John William Devitt, Maineville, OH (US);
Anthony S. Bauco, Horseheads, NY (US);
Craig Alan Cantello, Schenectady, NY (US);
Kevin G. Harding, Niskayuna, NY (US);
John William Devitt, Maineville, OH (US);
Anthony S. Bauco, Horseheads, NY (US);
Craig Alan Cantello, Schenectady, NY (US);
Kevin G. Harding, Niskayuna, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method facilitates inspection of a component surface. The method comprises positioning a surface of the component to be inspected in an optical path of at least one infrared radiation detector, heating the component surface using electromagnetic radiation to cause an increase in radiance from a defect present at the component surface, and detecting temperature variations within the component surface using the at least one infrared radiation detector, such that the surface irradiance is measured at predetermined locations across the component surface. The method further comprises detecting cracks in the component by analyzing radiation transient response data received by the infrared radiation detector, and correlating the temperature variations to the radiation transient response data to determine a depth of the detected cracks.