The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6874395 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 05, 2005

Filed:

Feb. 22, 2002
Applicants:

Toru Ishii, Hamamatsu, JP;

Hiromichi Matsui, Hamamatsu, JP;

Yasuaki Mizuno, Hamamatsu, JP;

Makoto Teraoka, Hamamatsu, JP;

Inventors:

Toru Ishii, Hamamatsu, JP;

Hiromichi Matsui, Hamamatsu, JP;

Yasuaki Mizuno, Hamamatsu, JP;

Makoto Teraoka, Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B26D003/00 ; B23Q015/00 ;
U.S. Cl.
CPC ...
Abstract

A punching device of the present invention is proposed which can perform positional alignment with high accuracy without generating positional deviation or vibration by shifting a workpiece, and which does not deteriorate the accuracy of determining the position of an image by shifting a photographic device. In this punching device, a CCD camera, which can photograph the position of the die hole upon the lower die and the position of the pattern upon the workpiece which shows the position thereon where punching is to be performed, is fixedly provided at a position removed from the raising and lowering track of the punch plate. Furthermore, a mirror may be provided between the CCD camera and the die hole upon the lower die.


Find Patent Forward Citations

Ishii, Toru. (2005). Punching device and workpiece processing method (U.S. Patent No. 6874395). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6874395

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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