The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2005
Filed:
Jul. 15, 2004
Reginald I. Vachon, Atlanta, GA (US);
Reginald I. Vachon, Atlanta, GA (US);
Other;
Abstract
Machine vision is used to track nodes on the perimeter of a geometric shape associated with a body undergoing cyclic loading, the geometric shape defining a target. The movement of the nodes is related to calculate strain through principles of Finite Element Analysis. The calculated strain is used to determine fatigue damage in the body based on an equation and data obtained using strain-controlled test methods. A finite element analysis fatigue gage includes (1) a sensor to capture the total image of the target and to output data representing the total image, (2) a computer program for (a) isolating the perimeter of the target using edging algorithms and the data, (b) tracking the movement of perimeter nodes of the target as the body undergoes deformation and recording the displacement, and (c) manipulating the data on movement of the nodes using (i) nonlinear stress analysis, (ii) finite element analysis, and (iii) material properties and characteristics and an equation based on strain-controlled test methods, and (3) a data display.